Mirroring ATPG Technology for Multi-Core Chips

Keqing Ouyang,Minqiang Peng, Jitong Zhou, Guohua Zhou, Youfa Wu

CONFERENCE OF SCIENCE & TECHNOLOGY FOR INTEGRATED CIRCUITS, 2024 CSTIC（2024）

Cited 0|Views2

Key words

Automatic Test Pattern Generation,Automatic Pattern,Manufacturing Defects,Test Data,Core Identity

AI Read Science

Must-Reading Tree

Example

Generate MRT to find the research sequence of this paper

Chat Paper

Summary is being generated by the instructions you defined