A Closed-Loop Chip Fast Binning Technology

Minqiang Peng,Keqing Ouyang, Jiawei Wang, Xiwu Chen, Guohua Zhou, Lei Chen

CONFERENCE OF SCIENCE & TECHNOLOGY FOR INTEGRATED CIRCUITS, 2024 CSTIC（2024）

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Key words

Binary Method,Test Circuit,Yield Improvement,Test Block,Difficulty Of Analysis,Closed-loop Structure,Binning Strategy,Target Block,Results Of Block

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