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Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET

Taeyoung Kim, Suhwan Lim, Ilho Myeong,Sanghyun Park, Suseong Noh,Seung Min Lee, Jongho Woo, Hanseung Ko, Youngji Noh, Moonkang Choi, Kiheun Lee,Sangwoo Han, Jongyeon Baek, Kijoon Kim, Dongjin Jung, Ji-sung Kim, Jaewoo Park,Seunghyun Kim, Hyoseok Kim, Sijung Yoo, Hyun Jae Lee,Duk-Hyun Choe,Seung-Geol Nam, Ilyoung Yoon, Chaeho Kim, Kwanzsoo Kim, Kwanzmin Park,Bong Jin Kuh,Jinseong Heo, Wanki Kim,Daewon Ha,Jaihyuk Song

2024 IEEE International Reliability Physics Symposium (IRPS)（2024）

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