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Characterization of Plasmas in Negative Ion Sources Using a Cs-H Collisional Radiative Model

JOURNAL OF INSTRUMENTATION(2024)

Cited 0|Views13
Key words
Ion sources (positive ions,negative ions,electron cyclotron resonance (ECR),electron beam (EBIS)),Plasma diagnostics- interferometry,spectroscopy and imaging,Plasma diagnostics- probes
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