Impact of Operational Parameters on dVDS/dt of SiC MOSFET and a Scheme for Gate Driver Resistance Selection to Limit dVDS/dt

2024 IEEE Applied Power Electronics Conference and Exposition (APEC)(2024)

引用 0|浏览2
暂无评分
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要