Exploring nanoscale metallic multilayer ta/cu films: Structure and some insights on deformation and strengthening mechanisms Daniel Karpinski,Tomas Polcar,Andrey BondarevMaterials Characterization(2024)引用 0|浏览0暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要