Trap states and carrier diffusion lengths in NiO/β-Ga2O3 heterojunctionsA. Y. Polyakov,E. B. Yakimov,D. S. Saranin,A. V. Chernykh,A. A. Vasilev,P. Gostishchev,A. I. Kochkova,L. A. Alexanyan,N. R. Matros,I. V. Shchemerov,S. J. PeartonJournal of Applied Physics（2024）引用 0|浏览23AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
