Resistance Switching and Carrier Transport Mechanisms of HfO $_{\text{2}}$ -Based Ferroelectric Diode

Minglei Ma,Gaobo Lin,Rongzong Shen,Jiacheng Xu,Haoji Qian,Jiani Gu,Huan Liu,Hongrui Zhang,Xiao Yu,Yan Liu,Jiajia Chen,Chengji Jin,Genquan Han

IEEE Transactions on Electron Devices（2024）

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关键词

Switches,Resistance,Current measurement,Electrical resistance measurement,Fitting,Hafnium oxide,Electrons,Carrier transport mechanisms,ferroelectric diode (FD),switching mechanisms

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