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Electrical and Dielectric Characterization of Ge Quantum Dots Embedded in MIS Structure (aupd/sio2:Ge QDs/n-Si) Grown by MBE

Maha A. Alenizi,Mansour Aouassa,Mohammed Bouabdellaoui,K. M. A. Saron,A. K. Aladim,Mohammed Ibrahim,Isabelle Berbezier

PHYSICA B-CONDENSED MATTER（2024）

Cited 3|Views7
Key words
Ge QDs,MBE growth,Metal-insulator-semiconductor,Structural properties,Electrical properties,Dielectric properties
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