The Mechanics of Light Elevated Temperature Induced Degradation (LeTID) on PERC Module: A Review

Jaljalalul Abedin Jony,Hasnain Yousuf,Muhammad Aleem Zahid,Simpy Sanyal,Muhammad Quddamah Khokhar, Polgampola Chamani Madara, Yifan Hu, Mengmeng Chu,Youngkuk Kim,Suresh Kumar Dhungel,Junsin Yi

Transactions on Electrical and Electronic Materials(2024)

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摘要
Passivated emitter and rear contact (PERC) cells are financially commanding and rapidly increasing PV system in the energy market. Its efficiency decreases over time because of the Light-Induced degradation (LID) that follows countless hours of exposure to light (above 50oC temperature), and collectively is termed as Light and Elevated Temperature Induced Degradation (LeTID). Every PERC solar cell module experiences the LeTID effect significantly. Excessive hydrogen injection into Si bulk creates the atomic-level defect structure, which is mainly guilty for the LeTID. Therefore, the normal lifetime of PERC modules has become less, and ultimately levelized cost of electricity (LCOE) of installed systems is increasing. All c-Si types of PV devices are degraded by 5
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关键词
LeTID,PERC,Atomic-level Defect Structure,Temperature,PV System
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