Fractal Analysis on Ag2O Thin Film Using a Data-driven Approach

The synthesis of fractal Ag oxide (Ag2O) on the surface of Ag thin film has been achieved at room temperature by using Synchrotron X-ray irradiation. We have performed an automated quantitative analysis of a batch of 1879 fractal Ag2O patterns in a scanning electron microscopy (SEM) image within a radius of 2000 μm outward from the center of the X-ray beam. The morphology is similar to that of the diffusion-limited cluster aggregation (DLCA) model. The fractal dimension (D) of Ag2O is between 1.7 and 1.5 from the center to the edge. The area distribution density of fractal Ag2O follows a quadratic function with radius R. It is found that the branches’ number of fractal Ag2O is a key factor affecting the fractal dimension. The more branches the fractal has, the greater the D is. This is the first time that Ag fractal has been investigated by combining automated data analysis methods with batch experimental data. This data-driven approach provides a new research perspective for rationally regulating materials’ fractal morphology and performance.