Relaxation Kinetics of Interface States and Bulk Traps in Atomic Layer Deposited ZrO2/β-Ga2O3 Metal-Oxide-semiconductor CapacitorsJiaxiang Chen,Haolan Qu,Jin Sui,Xing Lu,Xinbo ZouJournal of Applied Physics（2024）引用 1|浏览9AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
