Impact of Process Mismatch and Device Aging on SR-Latch Based True Random Number Generators.
International Workshop on Constructive Side-Channel Analysis and Secure Design(2024)
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要
International Workshop on Constructive Side-Channel Analysis and Secure Design(2024)