Design of Aging-Robust Clonable PUF Using an Insulator-Based ReRAM for Organic Circuits

We enhance the robustness of organic thin-film transistor (OTFT)-based physically unclonable functions (PUFs) against unstable output responses that originate from OTFT characteristic degradation. The proposed PUF incorporates a new resistive random access memory (ReRAM) constructed from metal-oxide thin films, enabling both ReRAM and OTFT components to be simultaneously fabricated using common materials and processes. The device combinations facilitate the efficient design of clonable PUF (CPUF) circuits with equivalent response outputs. Evaluations using measurements and simulations validate the successful operation of the CPUF.