Multiphase Reset Induced Reliable Dual-Mode Resistance Switching of the Ta/HfO2/RuO2 MemristorDong Hoon Shin, Hyungjun Park,Néstor Ghenzi, Yeong Rok Kim, Sunwoo Cheong,Sung Keun Shim, Seongpil Yim,Tae Won Park,Haewon Song,Jung Kyu Lee, Byeong Su Kim,Taegyun Park,Cheol Seong HwangACS Applied Materials & Interfaces(2024)引用 0|浏览2暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要