Microstructural evolution during the crystallization process of sol-gel derived PbZrO3 nanocomposite thin films

For the application of dielectric materials in energy storage, nanocomposition is one of the effective methods to improve their electric breakdown field strength. In this study, PbZrO3-Al2O3 nanocomposite films were prepared by combined thermal evaporation deposition and a sol–gel method. By changing the annealing time, the crystallization process of PbZrO3 matrix and the formation mechanism of Al2O3 nanoparticles were studied, and the microstructure evolution process of composite films was elucidated. The results indicate that before the final annealing at 700 ℃, Al atoms have diffused into the amorphous PbZrO3 film, and some fine grains of the perovskite phase have been generated at the bottom of the film. As the annealing time increases, the perovskite grains grow along the out of plane direction of the thin film to form columnar grains, and Al atoms diffuse into the perovskite phase lattice; As the annealing time further increases, Al2O3 nanoparticles began to precipitate at the interlayer interfaces of PbZrO3 coating layers, forming a layered distribution. The changes in electric properties with annealing time also demonstrate the microstructural evolution process of the composite film during annealing. Therefore, controlling annealing time is an effective means to control the microstructure and electric properties of composite films prepared by the new method for the application of energy storage.