Time-dependent model of temperature distribution in continuous flow pulsed electric field treatment chambers

A key component of a continuous flow pulsed electric field (PEF) system is the treatment chamber, where the product is exposed to electric pulses. Determination of the temperature distribution in the chamber during PEF treatment is important since high local increases in temperatures can affect the quality of the product. Coupled simulations of electric field, fluid flow, and heating in the existing literature do not model each individual electric pulse, but rather employ a “duty cycle” approach, which does not account for transient variations in treatment intensity and temperature changes in the medium. We present a time-dependent approach to modelling PEF treatment in continuous flow treatment chambers, which can model each pulse separately, and thus enables a more accurate study of temporal and spatial distributions of electric field and temperature. The model has been validated on laboratory scale treatment chambers of parallel plate or colinear design and using realistic protocols. Industrial relevance text The paper is relevant to all pulsed electric field (PEF) applications either on laboratory or industrial scale that implement a continuous flow treatment chamber. It presents an improved modelling approach which allows for an analysis of the electrical current, electric field, and temperature distribution in the chamber during, at the end, and in between application of electrical pulses. The model can be used to predict the peak temperature at the end of each pulse in the hot spots, which if large enough could potentially lead to thermal damage of the product or in extreme cases even potential local boiling of the medium, resulting not only in degradation of the treated product, but also in accelerated electrode fouling, oxidation, and dissolution (etching), as well as arcing. This would not only affect the quality of the treated product but would also affect the wear and lifetime of electrodes/chambers, and of the pulse generator. The model can also be used to avoid expensive trial-and-error optimization of the PEF protocols and chamber geometries in situ.