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Reliability and Failure Mode Analysis of High-Speed 850-Nm Multi-Mode and 795-Nm Single-Mode VCSELs for Space Applications

Yongkun Sin,Jesse Theiss,Michael Huang, Emily Tang, Jeffrey Childs,In-Tae Bae,Adam Bushmaker

VERTICAL-CAVITY SURFACE-EMITTING LASERS XXVIII（2024）

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Key words
High-speed multi-mode VCSEL,single-mode VCSEL,reliability,failure mode,atomic clock,space satellite
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