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Paving the Way for Pass Disturb Free Vertical NAND Storage Via A Dedicated and String-Compatible Pass Gate

Zijian Zhao,Sola Woo,Khandker Akif Aabrar,Sharadindu Gopal Kirtania,Zhouhang Jiang,Shan Deng,Yi Xiao,Halid Mulaosmanovic,Stefan Duenkel,Dominik Kleimaier,Steven Soss,Sven Beyer,Rajiv Joshi,Scott Meninger,Mohamed,Kijoon Kim,Jongho Woo,Suhwan Lim,Kwangsoo Kim,Wanki Kim,Daewon Ha,Vijaykrishnan Narayanan,Suman Datta,Shimeng Yu,Kai Ni

ACS APPLIED MATERIALS & INTERFACES（2024）

Cited 0|Views37
Key words
dual-port FeFET,disturb free,vertical NAND,FEOL,BEOL
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