Exploring Multi‐Bit Logic In‐Memory with Memristive HfO2‐Based Ferroelectric Tunnel Junctions (Adv. Electron. Mater. 3/2024)Wonwoo Kho,Hyunjoo Hwang,Seung‐Eon AhnAdvanced Electronic Materials(2024)引用 0|浏览0暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要