Development of near isogenic lines (NILs) for leaf rust resistance utilizing advanced generation segregating lines of RIL population in wheat (Triticum aestivum L.)

Near-isogenic lines (NILs) are useful genetic resources for basic genetic studies and further understanding of associated molecular mechanisms. The NILs can be developed through standard methods like backcross breeding or advanced generation segregating lines. The present study aimed the development of NILs for leaf rust resistance from the advanced generation segregating lines with residual heterozygosity. Advanced generations segregating lines/heterogeneous inbred families (HIFs) segregating for contrasting infection types (IT;1 and 3) for leaf rust were identified from the recombinant inbred lines (RILs) between cross of T. timopheevii derived introgression line Selection G12, a resistant parent and a susceptible parent Agra local. The molecular analysis using polymorphic SSR markers between parents indicated a high level of similarity with 97.07 and 96.49% resemblance among the contrasting NIL pairs from HIF1 and HIF5, respectively. These NILs may serve as valuable resources for conducting fine mapping and expression analysis of leaf rust resistance in wheat and, therefore, will help to identify candidate gene(s) for leaf rust resistance in Selection G12.