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Electric Field Mapping by Pockels Effect and I(V) Characteristic of CdTe Nuclear Detectors by Different Pt Contact Deposition

F. Lmai,A. Elouafi,M. Chafi,R. Moubah, S. Bahsine, M. Ayoub

Materials Today Proceedings(2024)

Cited 2|Views4
Key words
Semiconductor,Electric field,Pockels effect,Surface treatment,Molecular beam epitaxy,Cathode sputtering
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