A Comprehensive BRF Model for Spectralon? and Application to Hyperspectral Field Imagery

Chris H. Lee,Charles M. Bachmann, Nayma Binte Nur,Yiwei Mao, David N. Conran, Timothy D. Bauch

IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING(2024)

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摘要
We present a comprehensive hyperspectral bi-directional reflectance model for a pristine optical-grade white Spectralon panel with full azimuthal coverage, a wide range of view zenith angles, and incident illumination zenith angles, throughout ultraviolet (UV), visible near-infrared (VNIR), and shortwave infrared (SWIR) wavelengths (350-2500 nm). Measurements were acquired using the Goniometer of the Rochester Institute of Technology-Two (GRIT-T), which incorporates Analytical Spectral Device (ASD) FieldSpec Full-Range 4 (FR4) spectroradiometers. Residual plots show that the empirical model is accurate to within 1%-2% reflectance within most of the observing hemisphere. We demonstrate an application of the Spectralon panel model to hyperspectral imagery (HSI) acquired during a field experiment at the RIT Tait Preserve where a pair of field Spectralon panels was imaged from various view geometries from both drone and mast-mounted hyperspectral imaging systems.
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关键词
Calibration,goniometers,hyperspectral imaging,radiometry
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