Robust Rao-type tests for step-stress accelerated life-tests under interval-monitoring and Weibull lifetime distributions
arxiv(2024)
摘要
Many products in engineering are highly reliable with large mean lifetimes to
failure. Performing lifetests under normal operations conditions would thus
require long experimentation times and high experimentation costs.
Alternatively, accelerated lifetests shorten the experimentation time by
running the tests at higher than normal stress conditions, thus inducing more
failures. Additionally, a log-linear regression model can be used to relate the
lifetime distribution of the product to the level of stress it experiences.
After estimating the parameters of this relationship, results can be
extrapolated to normal operating conditions. On the other hand, censored data
is common in reliability analysis. Interval-censored data arise when continuous
inspection is difficult or infeasible due to technical or budgetary
constraints. In this paper, we develop robust restricted estimators based on
the density power divergence for step-stress accelerated life-tests under
Weibull distributions with interval-censored data. We present theoretical
asymptotic properties of the estimators and develop robust Rao-type test
statistics based on the proposed robust estimators for testing composite null
hypothesis on the model parameters.
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