Micro-latch and Single Event Upset phenomena observed during accelerated atmospheric neutron testing of 40-90 nm Commercial Off The Shelf Static Random Access Memories

This paper summarizes observations of micro-SEL phenomena during the SEU testing of sub 100 nm COTS SRAMs with an accelerated atmospheric neutron spectra. SEU statistics are compared with historic data to demonstrate there is not a potential SEU increased susceptibility for modern COTS SRAMs however the static test method may have displayed characteristics i.e. micro-latches that may not be visible from a pseudo-static test. The SEU cross sections demonstrates the essential requirement to continue to test SRAMs for their responses to atmospheric neutrons particularly those which will be used within critical applications e.g. flight avionics.