Individual Iso-Electronic N and Bi Centers in GaAs Studied by Scanning Tunneling MicroscopyP. M. Koenraad,C. M. Krammel,Rianne C. Plantenga,Victoria Kortan,Michael E. Flatté, Freddy Tilley, Mervin Roy,P. A. Maksym,Takashi KitaBulletin of the American Physical Society（2016）引用 23|浏览0AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
