Reliability of Enhancement-Mode P-Gan Gate GaN HEMT with Multiple Field Plates

Yingqiang Wei,Jinghe Wei,Wei Zhao, Suzhen Wu,Yidan Wei, Meijie Liu, Zhiyuan Sui, Ying Zhou,Yuqi Li, Hong Chang, Fei Ji, Weibin Wang, Lijun Yang, Guozhu Liu

SEMICONDUCTOR SCIENCE AND TECHNOLOGY（2024）

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Key words

p-GaN gate GaN HEMT,multiple field plates,electric field modulation,reliability,electron trapping

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