Pixelated Diamond Detector with High Density Waveform Readout for Charged Particle Beam Line Characterization

In this report we describe a novel pixelated diamond detector for the measurement and characterization of accelerator beam particle bunches both spatially and temporally by utilizing on-detector trace lithography and read out by system-on-chip (SoC) high density waveform digitizers developed by Nalu Scientific LLC (NSL). The theory, detection methodology, and planned instrumentation will be discussed, as well as initial measurements.