A Compact Design of SPAD Detector with Quenching Circuit for Reduced Dark Count Rate

We present a compact design of a Single-Photon Avalanche Diode (SPAD) detector with a Passive Quenching Active Reset (PQAR) circuit for reducing the Dark Count Rate (DCR). Fabricated in 0.11 mu m CMOS Technology, the single pixel includes the SPAD device, quenching circuit, and a 10-bit counter. The integration of the PQAR circuit effectively suppresses the dark counts and improves the overall performance of the SPAD detector. By applying an excess bias of 2.5V, we achieved a DCR of 150cps.