A Novel Sensor-Reduction Condition Monitoring Approach for MMC Submodule IGBTs Based on Statistics of Inferred On-State Voltage
IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS(2024)
摘要
Condition monitoring (CM) of modular multilevel converters (MMCs) submodule insulated gate bipolar transistors (IGBTs) is of significance to ensure reliable operation. The ON-state voltage of IGBT is a promising indicator to perform CM while its application in MMC is tricky due to high blocking voltage and numerous submodules. In this article, a novel sensor-reduction approach is presented to infer the ON-state voltages of MMC submodule IGBTs. Such an estimation method of the ON-state voltages is based ON Kirchhoff's voltage law (KVL) applied to an MMC arm. This method focuses on a statistical analysis of capacitor voltages and arm voltages. The switching-state combinations are specifically selected for the purpose. A case study is conducted on a single-phase seven-level MMC test bench to verify the proposed ON-state voltage estimation method, which only shows an error of less than 3%. Furthermore, continuous ON-state voltage estimations are made with this MMC test bench under steady-state operations and carry out statistical analysis of the inferred ON-state voltage at various deterioration levels. Finally, a confusion matrix is proposed, whose maximum accuracy reaches 92.4% for the early-deterioration condition.
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关键词
Voltage measurement,Insulated gate bipolar transistors,Capacitors,Switches,Temperature measurement,Current measurement,Junctions,Condition monitoring (CM),insulated gate bipolar transistor (IGBT),modular multilevel converter (MMC),text voltage,sensor-reduction
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