Current-Voltage Modeling of DRAM Cell Transistor Using Genetic Algorithm and Deep Learning
IEEE Access（2024）
Key words
Integrated circuit modeling,Genetic algorithms,Transistors,Optimization,Statistics,Sociology,Random access memory,Deep learning,Insulated gate bipolar transistors,BSIM-CMG,deep learning,genetic algorithm,I-V modeling,compact modeling,BCAT,DRAM cell transistor,HCD
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