Self-Aligned WO <sub>x</sub> S/D Contacts to Gate Stacks with TiO <sub>x</sub> Nucleation Layer by Multiple-Deposition Method in WSe <sub>2</sub> pFETs

Extended Abstracts of the 2023 International Conference on Solid State Devices and Materials(2023)

引用 0|浏览7
暂无评分
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要