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QTL Mapping: Insights into Genomic Regions Governing Component Traits of Yield under Combined Heat and Drought Stress in Wheat

Karthik Kumar Manjunath,Hari Krishna,Narayana Bhat Devate,V. P. Sunilkumar, Sahana Police Patil,Divya Chauhan,Shweta Singh,Sudhir Kumar,Neelu Jain,Gyanendra Pratap Singh,Pradeep Kumar Singh

FRONTIERS IN GENETICS（2024）

引用 4|浏览27
关键词
wheat,quantitative trait locus,heat,drought,combined stress
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