Integrated AC Power Cycling Platform with Automated Characterization for T-Type Power Module in Photovoltaic Applications

Ahmed Siraj, Cheng Wan,Dehao Qin,Yi Li,Zheyu Zhang, Matt Ursino,Miles Russell

2023 IEEE Energy Conversion Congress and Exposition (ECCE)(2023)

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摘要
The reliability of power electronic modules can be assessed by stress testing the devices and characterizing them. AC power cycling provides the platform to stress the devices in exact field conditions. This paper exhibits the existing state of the art in AC power cycling test benches and demonstrates the uniqueness of the newly developed test bench for PV inverter application. Characterizing is an essential part of the reliability model development. It becomes a challenge to characterize the T-type IGBT modules and visualize results because they are complex and time-consuming, especially for power modules based on a non-phase-leg configuration, such as T-type circuits, widely applied for PV inverters. This paper focuses on stress testing with a built-in characterization platform for easy and time-efficient characterization of T-type IGBT modules. First, state of the art in AC power cycling is presented. Second, the unique features of the stress testing platform are shown. Finally, the test result has been presented for the newly built platform.
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关键词
AC power cycling,characterization,T-type neutral point clamped IGBT,reliability,static and dynamic characterization,automation
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