Domain-Specific Machine Learning Based Minimum Operating Voltage Prediction Using On-Chip Monitor Data.
2023 IEEE International Test Conference (ITC)(2023)
摘要
Determining the minimum operating voltage (
$V_{min}$
) of chip designs is critical for low power dissipation and assurance of quality and functional safety during manufacturing tests and in-field monitoring. We demonstrate how on-chip monitor data can be leveraged to provide accurate minimum operating voltage prediction using a domain-specific machine learning approach. Given limited measured chip data, the key challenge in developing a machine learning approach is to provide an accurate prediction while addressing overfitting and selecting a subset of optimal features. To this end, we propose to utilize a novel monotonic lattice neural network architecture that is geared towards accurate prediction by imposing domain-specific monotonic relationships between the input sensor data and
$V_{min}$
. Furthermore, we perform an effective feature selection by considering both the correlation between each feature and
$V_{min}$
as well as the co-linearity between the features. Experiments demonstrate superior performance in comparison with linear regression and conventional neural networks.
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关键词
Chip performance prediction,On-chip monitor,Machine learning,Monotonicity
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