A Noncontact Method for Simultaneous Measurement of di/dt and dv/dt

In this letter, we propose a noncontact method for simultaneously measuring the current and voltage change rates by Rogowski coils. The dv/dt measurement capability is achieved based on electric field coupling, which is incorporated into the state-of-the-art Rogowski coil-based current sensing solutions. The application of the proposed method for power semiconductor devices is demonstrated by a case study of an insulated gate bipolar transistor (IGBT) switching circuit. The Rogowski coils are integrated with a printed circuit board (PCB) and fit with the IGBT module terminals. The comparable results from high-performance commercial instruments verify the di/dt and dv/dt measurement accuracy of the presented compact and cost-effective solution.