Photothermal vortex interferometer with azimuthal complex spectra analysis for the measurement of laser-induced nanoscale thermal lens dynamics

REVIEW OF SCIENTIFIC INSTRUMENTS(2023)

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摘要
A photothermal vortex interferometer (PTVI) is proposed to fill the gap of full-field measurement of the laser-induced nanoscale thermal lens dynamics of optical elements. The PTVI produces a multi-ring petal-like interferogram by the coaxial coherent superposition of the high-order conjugated Laguerre-Gaussian beams. The non-uniform optical path change (OPC) profile resulting from the thermal lens causes the petals of the interferogram at the different radii to shift by the different azimuths. To demodulate such an interferogram, an azimuthal complex spectra analysis is presented by using a camera with a pixelated multi-ring pattern written on its sensor to extract multiple azimuthal intensity profiles synchronously from the interferogram. Therefore, the OPC profile can be determined dynamically from the complex spectra of the azimuthal intensity profiles at the main frequency components. An analytical thermophysical model of the thermal lens is given, and the basic principle of the azimuthal complex spectra analysis is revealed. A proof-of-concept experiment is demonstrated using a N-BK7 glass sample heated by a pump laser. The results verified that the PTVI achieves the measurement accuracy of 47 pm with a standard deviation of 358 pm (3 sigma) and can be used for full-field measurement of the nanoscale OPC profile caused by the thermal lens dynamics. Due to the picometer-scale accuracy of the PTVI, the absorption coefficient and thermal diffusivity of the glass sample were determined to be A(0) = 0.126 m(-1) and D = 5.63 x 10(-7) m(2) s(-1), respectively, which agree with the nominal ones of A(0) = 0.129 m(-1) and D = 5.17 x 10(-7) m(2) s(-1). Although the PTVI is only suitable for measuring the rotationally symmetric OPC, it shows less computation burden and hardware complexity, and it is proved to be a highly sensitive and effective tool in studying optical, thermo-physical, and mechanical properties of optical elements.
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