Comparison of Fourier-transformed and Wavelet-transformed EXAFS

Local structural properties of compounds are often critical to understand the physical and chemical properties of the systems. Extended X-ray absorption fine structure (EXAFS) is a unique tool to describe local structural properties around a selected species of atoms in matter. A detailed analysis of Fourier-transformed EXAFS (FT-EXAFS) data is used to quantitatively determine the local structural properties. The recent studies suggest that wavelet-transformed EXAFS (WT-EXAFS) can visibly distinguish between the atoms which are located at similar distances from a probing atom. In this paper, we theoretically examined the WT-EXAFS of transition metals of Ti, Cu, and Zr atoms to visibly divide them from Pt atoms using superlet methods with an enhanced resolution. The theoretical calculations of WT-EXAFS showed that Ti, Cu, and Zr atoms are visibly distinguished from a Pt atom. The WT-EXAFS analysis of Pt nanoparticles on TiO 2 and ZrO 2 supports indicated that it can be used to visibly describe interfacial structures of nanoparticles and metal support.