Diffraction with X-rays and neutrons

The principle of diffraction using X-rays and neutrons in the kinematical approximation is presented in a fundamental manner. The diffraction patterns with both X-rays and neutrons are in fact, the squares of the Fourier transform of the scattering arrays. Since X-rays interact directly with electrons, whilst neutrons interact directly with nuclei and spins, these two probes can be used sometimes as complementary tools for structural studies. For X-rays, we focus on the use of a synchrotron source which provides the energy tenability, high brilliance, and coherence of incident X-rays. Using such properties, surface and interface structure studies of semiconductors, as an example of areas that have benefited from synchrotron X-rays will be shown. And also, a principle of coherent X-ray diffraction will be explained. For neutrons, we focus on the use of neutron spallation source based on proton accelerators which make use of the time-of-flight diffraction method. As a practical application using this method, structural analysis of lithium-ion battery materials will be presented.