Fast and Accurate Aging-Aware Cell Timing Model via Graph Learning

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS(2024)

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摘要
With transistors scaling down, aging effects become increasingly significant in circuit design. Thus, the aging-aware cell timing model is necessary for evaluating the aging-induced delay degradation and their impact on circuit performance. However, the tradeoff between accuracy and efficiency becomes a bottleneck in traditional methods. In this brief, we propose a fast and accurate aging-aware cell timing model via graph learning. The information of multi-typed devices on different arcs can be embedded by heterogeneous graph attention networks (H-GAT) and the embedded results help improve the accuracy of our aging-aware timing model. The experimental results indicate the proposed timing model can achieve high accuracy efficiently.
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关键词
Integrated circuit modeling,Delays,Transistors,Degradation,Capacitors,Aging,Resistors,Timing analysis,graph learning,design for reliability
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