The Unique EELS Signature of Point Defects in Cubic Boron Nitride on Diamond

Journal Article The Unique EELS Signature of Point Defects in Cubic Boron Nitride on Diamond Get access Andrew C Lang, Andrew C Lang Materials Science and Technology Division, U.S. Naval Research Laboratory, Washington DC, United States Corresponding author: andrew.lang@nrl.navy.mil Search for other works by this author on: Oxford Academic Google Scholar David F Storm, David F Storm Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington DC, United States Search for other works by this author on: Oxford Academic Google Scholar Sergey I Maximenko, Sergey I Maximenko Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington DC, United States Search for other works by this author on: Oxford Academic Google Scholar Neeraj Nepal, Neeraj Nepal Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington DC, United States Search for other works by this author on: Oxford Academic Google Scholar Virginia D Wheeler, Virginia D Wheeler Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington DC, United States Search for other works by this author on: Oxford Academic Google Scholar David J Meyer David J Meyer Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington DC, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Page 1798, https://doi.org/10.1093/micmic/ozad067.930 Published: 22 July 2023