Validation of a Model of the Symbia Intevo Bold SPECT Scanner for Monte Carlo Simulations

M.H.H. Bui, A. Robert,J.N. Badel,M. Kvassheim,C. Stokke,S. Rit,A. Etxebeste

2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)（2023）

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Imaging,Spectral Imaging

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