Comparing Digital Modulation Schemes in RF Receivers for Bit Errors Induced by Single-Event Transients in the Low-Noise Amplifier
IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2024）
关键词
Radio frequency,Frequency shift keying,Receivers,Binary phase shift keying,Laser pulses,Decoding,Transient analysis,Digital modulation,low-noise amplifier,radiation,silicon-germanium (SiGe) BiCMOS,single-event transient (SET),single-event upset (SEU)
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