Induced Current Thermo-Electrical Impedance Tomography for Nonferromagnetic Metal Material Surface Defect Profile Reconstruction

Nonferromagnetic metal materials are widely used in industry. Defects generated during manufacture and use may lead to serious accidents. The defect reconstruction is important for nondestructive evaluation. Eddy current pulsed thermography (ECPT) is a well-known nondestructive testing and evaluation method, but hardly reconstruct fully defect profile. Electrical impedance tomography (EIT) shows promising potential in defect profile reconstruction, but suffers from electrode number limitation. In this paper, EIT is introduced to ECPT image sequences processing, and a new method, induced current thermo-electrical impedance tomography (ICTEIT), is developed. The proposed method takes each infrared camera pixel as a virtual electrode, captures the electric current distribution with spatial resolution as high as camera, and reconstructs conductivity distribution at pixel level from which the defect profile can be identified. Experiments with different defects are carried out to verify the performance of the proposed method.