Revealing Topological Properties of Materials: The New Characterization Frontier in Electron Microscopy

Microscopy and Microanalysis（2023）

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Journal Article Revealing Topological Properties of Materials: The New Characterization Frontier in Electron Microscopy Get access Juan Carlos Idrobo Juan Carlos Idrobo Materials Science & Engineering Department, University of Washington, Seattle, WA, USAPhysical Sciences Division, Pacific Northwest National Laboratory, Richland, WA, USA Corresponding author: jidrobo@uw.edu Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Page 1734, https://doi.org/10.1093/micmic/ozad067.896 Published: 22 July 2023

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关键词

electron microscopy,topological properties,new characterization frontier

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