Generalized Modeling of Photoluminescence Transients

The result presented in article number 2200339 by Max Großmann and co-workers is a universal statistical method for the analysis of time-resolved photoluminescence (TRPL) measurements. The method can be used to fit multiple TRPL transients simultaneously using general kinematic models. The cover image demonstrates the entire process of the analysis of TRPL data in a visually appealing way by representing the four key ingredients: a suitable sample such as a semiconductor double-heterostructure, a state-of-the-art measurement setup, a kinetic model appropriate for the description of the sample behaviour, and a tailored analysis method to extract the model parameters of interest from the measured TRPL transients.