Correction to Electrostatic Discovery Atomic Force Microscopy

ADVERTISEMENT RETURN TO ISSUEPREVAdditions and Correc...Additions and CorrectionsNEXTORIGINAL ARTICLEThis notice is a correctionCorrection to Electrostatic Discovery Atomic Force MicroscopyNiko OinonenNiko OinonenDepartment of Applied Physics, Aalto University, 00076 Aalto, Espoo, FinlandMore by Niko Oinonen, Chen XuChen XuDepartment of Applied Physics, Aalto University, 00076 Aalto, Espoo, FinlandMore by Chen Xuhttps://orcid.org/0000-0003-2730-1025, Benjamin AlldrittBenjamin AlldrittDepartment of Applied Physics, Aalto University, 00076 Aalto, Espoo, FinlandMore by Benjamin Alldritthttps://orcid.org/0000-0002-9383-6995, Prokop HapalaProkop HapalaFZU - Institute of Physics of the Czech Academy of Sciences, 182 21 Prague 8, CzechiaMore by Prokop Hapalahttps://orcid.org/0000-0003-4807-0326, Filippo Federici CanovaFilippo Federici CanovaDepartment of Applied Physics, Aalto University, 00076 Aalto, Espoo, FinlandNanolayers Research Computing Ltd., London N12 OHL, United KingdomMore by Filippo Federici Canova, Fedor UrtevFedor UrtevDepartment of Applied Physics, Aalto University, 00076 Aalto, Espoo, FinlandDepartment of Computer Science, Aalto University, 00076 Aalto, Espoo, FinlandMore by Fedor Urtev, Shuning CaiShuning CaiDepartment of Applied Physics, Aalto University, 00076 Aalto, Espoo, FinlandMore by Shuning Cai, Ondřej KrejčíOndřej KrejčíDepartment of Applied Physics, Aalto University, 00076 Aalto, Espoo, FinlandMore by Ondřej Krejčíhttps://orcid.org/0000-0002-4948-4312, Juho KannalaJuho KannalaDepartment of Computer Science, Aalto University, 00076 Aalto, Espoo, FinlandMore by Juho Kannala, Peter Liljeroth*Peter LiljerothDepartment of Applied Physics, Aalto University, 00076 Aalto, Espoo, Finland*Email: [email protected]More by Peter Liljerothhttps://orcid.org/0000-0003-1253-8097, and Adam S. Foster*Adam S. FosterDepartment of Applied Physics, Aalto University, 00076 Aalto, Espoo, FinlandWPI Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, Kakuma-machi, Kanazawa 920-1192, Japan*Email: [email protected]More by Adam S. Fosterhttps://orcid.org/0000-0001-5371-5905Cite this: ACS Nano 2022, 16, 9, 15496Publication Date (Web):September 14, 2022Publication History Received15 August 2022Published online14 September 2022Published inissue 27 September 2022https://doi.org/10.1021/acsnano.2c08130Copyright © 2022 The Authors. Published by American Chemical SocietyRIGHTS & PERMISSIONSACS AuthorChoiceCC: Creative CommonsBY: Credit must be given to the creatorArticle Views487Altmetric-Citations-LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InReddit PDF (915 KB) Get e-AlertsSUBJECTS:Atomic force microscopy,Electrostatics Get e-Alerts