Preliminary study of electronics reliability in ITER neutron environment

Martin Dentan, Gianluca Borgese,Jean-Luc Autran,Daniela Munteanu,Soilihi Moindjie, Jérôme Bucalossi,Philippe Moreau, Francis-Pierre Pellissier, Benjamin Santraine,Philippe Roche,Victor Malherbe,Rubén García Alía,Matteo Cecchetto

HAL (Le Centre pour la Communication Scientifique Directe)（2022）

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摘要

We validated a method for predicting the Soft Error Rate (SER) in the WEST tokamak operated with deuterium plasmas, and we applied it to predict the SER in the ITER tokamak operated with deuterium-tritium plasmas.

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CMOS,deuterium–deuterium (D-D),deuterium–tritium (D-T),fusion,neutron,real-time experiment,single event effects (SEE),single-event upset,static random access memory (SRAM),tokamak,ITER,WEST

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