Influence of plasma grid bias on the beam extraction of RF driven negative hydrogen ion source

In the negative hydrogen ion sources, the positive bias of the plasma grid with respect to the discharge chamber is often used to suppress co-extracted electrons. Because most of the co-extracted electrons are magnetically deflected onto the extraction grid, the difference between the extraction and acceleration current (i.e., I-ext - I-acc) is commonly used to represent the number of co-extracted electrons. In the single-driver RF negative ion source at ASIPP, the variation of I-ext - I-acc with the plasma grid bias voltage was accidentally found to have different trends with and without the Cs seeding. When the current density of I-acc (regarded as J(H-)) was larger than 120 A/m(2) during Cs conditioning, the I-ext - I-acc fell first and then rose with the increasing bias voltage. The previous research results from NIFS that the beam optics were changed by the bias voltage can be used to explain the phenomenon. In this paper, the electron temperature (T-e) in front of the plasma grid was found to increase from the Langmuir probe measurement, when the bias voltage was higher than a threshold of 4.5 V to the float potential. Interestingly, the bias voltage corresponding to the trough of I-ext - I-acc was higher than the float potential-a similar value of 4.1 V to the threshold of T-e increasing. Since the negative hydrogen ions are easily destroyed by the high-energy electrons, the increasing of Te may also cause the change of beam optics and the increase in co-extracted electrons. The electron energy distribution function was used to explain the change of plasma parameters in front of the plasma grid.