A New X-ray Beam Induced Current Setup, Coupled with X-ray Diffraction Imaging, for Diamonds and Semiconductors Characterization by Synchrotron Techniques at ESRF

F. Lafont,J. Baruchel, J. Bousquet, E. Capria, R. Celestre,M. Cotte,D. Dauvergne, P. Everaere,M. L. Gallin-Martel,C. Hoarau, O. Ibourk,J. Letellier, R. Molle, D. Z. Nusimovici, M. Reynaud, T. N. Tran-Caliste

DIAMOND AND RELATED MATERIALS（2023）

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关键词

Diamond,X-ray Beam Induced Current,X-ray Bragg diffraction imaging,Single crystal,Structural defects,Electronic properties

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